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Dual Pattern Elements for Scan Loss Reduction in Wide-Angle Scanning Phased Arrays

Dual Pattern Elements Scan Loss is a M.Tech project topic for Electronics & Communication Engineering. Explore the IEEE-style abstract, reference…

Communication Systems Electronics & Communication Engineering M.Tech Project Ideas Phased Arrays Satellite & Radar
Dual Pattern Elements for Scan Loss Reduction in Wide-Angle Scanning Phased Arrays - Fried Engineers Project Topic

Dual Pattern Elements Scan Loss is a M.Tech project topic for Electronics & Communication Engineering. It gives students a clear starting point for research, implementation planning, and documentation.

Dual Pattern Elements Scan Loss Project Details

Abstract

Active electronically scanned arrays (AESAs) and reconfigurable intelligent surfaces (RIS) are key parts of modern radar systems and high‑capacity telecom networks. Keeping high gain when the beam scans far off‑broadside is still difficult because each radiating element loses gain as the scan angle increases. This project guide, based on research, focuses on modeling and simulating a new dual‑pattern radiating element that reduces scan loss over wide angles. Instead of using complex, power‑hungry control electronics, the approach uses a simple switch to select between two feed points in the element, producing two complementary radiation patterns. The framework helps you simulate the element’s electromagnetic performance, evaluate the active reflection coefficient, and analyze

the overall array factor across large scan angles. By implementing the design in high‑frequency electromagnetic simulation software, you can compare system complexity with scan performance and explore a practical path toward next‑generation wide‑angle scanning phased arrays for satellite and radar applications.
Reference Paper Dual Pattern Elements for Scan Loss Reduction in Wide-Angle Scanning Phased Arrays
Domain Electronics & Communication Engineering
Sub-Domain Communication Systems / Satellite & Radar / Phased Arrays
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